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JIS C 5402-11-12
Connectors for electronic equipment -- Tests and measurements -- Part 11-12: Climatic tests -- Test 11m: Damp heat, cyclic
JIS C 5402-11-12:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-12: Climatic tests -- Test 11m: Damp heat, cyclic

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JIS C 5402-11-13
Connectors for electronic equipment -- Tests and measurements -- Part 11-13: Climatic tests -- Test 11n: Gas tightness, solderless wrapped connections
JIS C 5402-11-13:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-13: Climatic tests -- Test 11n: Gas tightness, solderless wrapped connections

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JIS C 5402-11-14
Connectors for electronic equipment -- Tests and measurements -- Part 11-14: Climatic tests -- Test 11p: Flowing single gas corrosion test
JIS C 5402-11-14:2006

Connectors for electronic equipment -- Tests and measurements -- Part 11-14: Climatic tests -- Test 11p: Flowing single gas corrosion test

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JIS C 5402-11-2
Connectors for electronic equipment -- Tests and measurements -- Part 11-2: Climatic tests -- Test 11b: Combined/sequential cold, low air pressure and damp heat
JIS C 5402-11-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-2: Climatic tests -- Test 11b: Combined/sequential cold, low air pressure and damp heat

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JIS C 5402-11-3
Connectors for electronic equipment -- Tests and measurements -- Part 11-3: Climatic tests -- Test 11c: Damp heat, steady state
JIS C 5402-11-3:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-3: Climatic tests -- Test 11c: Damp heat, steady state

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JIS C 5402-11-4
Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature
JIS C 5402-11-4:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature

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JIS C 5402-11-5
Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth
JIS C 5402-11-5:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth

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JIS C 5402-11-6
Connectors for electronic equipment -- Tests and measurements -- Part 11-6: Climatic tests -- Test 11f: Corrosion, salt mist
JIS C 5402-11-6:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-6: Climatic tests -- Test 11f: Corrosion, salt mist

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JIS C 5402-11-7
Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test
JIS C 5402-11-7:2006

Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test

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JIS C 5402-11-9
Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat
JIS C 5402-11-9:2005

Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat

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JIS C 5402-1-2
Connectors for electronic equipment -- Tests and measurements -- Part 1-2: General examination -- Test 1b: Examination of dimension and mass
JIS C 5402-1-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 1-2: General examination -- Test 1b: Examination of dimension and mass

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JIS C 5402-12-7
Connectors for electronic equipment -- Tests and measurements -- Part 12-7: Soldering tests -- Test 12g: Solderability, wetting balance method
JIS C 5402-12-7:2005

Connectors for electronic equipment -- Tests and measurements -- Part 12-7: Soldering tests -- Test 12g: Solderability, wetting balance method

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JIS C 5402-20-2
Electromechanical components for electronic equipment -- Basic testing procedures and measuring methods -- Part 20-2: Test 20b -- Flammability tests -- Fireproofness
JIS C 5402-20-2:2005

Electromechanical components for electronic equipment -- Basic testing procedures and measuring methods -- Part 20-2: Test 20b -- Flammability tests -- Fireproofness

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JIS C 5402-2-1
Connectors for electronic equipment - Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests -- Test 2a : Contact resistance -- Millivolt level method
JIS C 5402-2-1:2005

Connectors for electronic equipment - Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests -- Test 2a : Contact resistance -- Millivolt level method

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JIS C 5402-2-3
Connectors for electronic equipment -- Tests and measurements -- Part 2-3: Electrical continuity and contact resistance tests -- Test 2c: Contact resistance variation
JIS C 5402-2-3:2005

Connectors for electronic equipment -- Tests and measurements -- Part 2-3: Electrical continuity and contact resistance tests -- Test 2c: Contact resistance variation

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JIS C 5402-23-3
Electromechanical components for electronic equipment -- Basic testing procedures and measuring methods -- Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories
JIS C 5402-23-3:2005

Electromechanical components for electronic equipment -- Basic testing procedures and measuring methods -- Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories

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JIS C 5402-2-6
Connectors for electronic equipment -- Tests and measurements -- Part 2-6: Electrical continuity and contact resistance tests -- Test 2f: Housing (shell) electrical continuity
JIS C 5402-2-6:2005

Connectors for electronic equipment -- Tests and measurements -- Part 2-6: Electrical continuity and contact resistance tests -- Test 2f: Housing (shell) electrical continuity

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JIS C 5402-3-1
Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance
JIS C 5402-3-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance

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JIS C 5402-4-2
Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge
JIS C 5402-4-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge

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JIS C 5402-4-3
Connectors for electronic equipment -- Tests and measurements -- Part 4-3: Voltage stress tests -- Test 4c: Voltage proof of pre-insulated crimp barrels
JIS C 5402-4-3:2005

Connectors for electronic equipment -- Tests and measurements -- Part 4-3: Voltage stress tests -- Test 4c: Voltage proof of pre-insulated crimp barrels

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JIS C 5402-5-1
Connectors for electronic equipment -- Tests and measurements -- Part 5-1: Current-carrying capacity tests -- Test 5a: Temperature rise
JIS C 5402-5-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 5-1: Current-carrying capacity tests -- Test 5a: Temperature rise

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JIS C 5402-5-2
Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating
JIS C 5402-5-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating

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JIS C 5402-6-1
Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state
JIS C 5402-6-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state

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JIS C 5402-6-2
Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump
JIS C 5402-6-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump

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JIS C 5402-6-3
Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock
JIS C 5402-6-3:2005

Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock

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