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SAE ARP6338 Rev A

Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits
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SAE ARP6338 Rev A

Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits

PUBLISH DATE 2019
PAGES 14
SAE ARP6338 Rev A
This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations. This document focuses on the LLM wearout assessment process. It acknowledges that the AADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.
SDO SAE: SAE International
Document Number ARP6338
Publication Date Feb. 8, 2019
Language en - English
Page Count 14
Revision Level A
Supercedes
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