SAE AS6171/11 Rev A

Current Revision
Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods

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SAE AS6171/11 Rev A

Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods

PUBLISH DATE 2018
SAE AS6171/11 Rev A

This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including:

  • Operator training;
  • Sample preparation;
  • Imaging techniques;
  • Data interpretation;
  • Design/functional matching;
  • Equipment maintenance; and
  • Reporting of data.

The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data.

The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity.

If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

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