Logo
Login Sign Up
Current Revision

SAE J2052 (JUL2016)

Test Device Head Contact Duration Analysis
Best Price Guarantee
Instant

$85.00

2-5 Days

$85.00

SAVE 10%

$153.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
SAE International Logo

SAE J2052 (JUL2016)

Test Device Head Contact Duration Analysis

PUBLISH DATE 2016
PAGES 7
SAE J2052 (JUL2016)
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
SDO SAE: SAE International
Document Number J2052
Publication Date July 12, 2016
Language en - English
Page Count 7
Revision Level 201607
Supercedes
Committee
Loading...

Failed to load document history.

Publish Date Document Id Type View