SAE J2052 (JUL2016)

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Test Device Head Contact Duration Analysis

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SAE J2052 (JUL2016)

Test Device Head Contact Duration Analysis

PUBLISH DATE 2016
PAGES 7
SAE J2052 (JUL2016)

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

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