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BSI BS EN 60749-26:2014

Semiconductor devices. Mechanical and climatic test methods -- Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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BSI BS EN 60749-26:2014

Semiconductor devices. Mechanical and climatic test methods -- Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

PUBLISH DATE 2014
PAGES 44
BSI BS EN 60749-26:2014

This standard establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

The purpose (objective) of this standard is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels.

ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. The HBM and MM test methods produce similar but not identical results; unless otherwise specified, this test method is the one selected.

SDO BSI: British Standards Institution
Document Number EN 60749-26
Publication Date June 30, 2014
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
June 30, 2014 BS EN 60749-26:2014 Revision
Sept. 29, 2006 BS EN 60749-26:2006 Revision