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BSI BS EN IEC 60749-26:2026

Semiconductor devices. Mechanical and climatic test methods -- Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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BSI BS EN IEC 60749-26:2026

Semiconductor devices. Mechanical and climatic test methods -- Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

PUBLISH DATE 2026
PAGES 56
BSI BS EN IEC 60749-26:2026
IEC 60749-26:2025 establishes the procedure for testing, evaluating, and classifying components and microcircuits in accordance with their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749‑27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected. This edition includes the following significant technical changes with respect to the previous edition: a) new definitions have been added; b) text has been added to clarify the designation of and allowances resulting from “low parasitics”. The new designation includes the maximum number of pins of a device that can pass the test procedure.
SDO BSI: British Standards Institution
Document Number IEC 60749-26
Publication Date Feb. 24, 2026
Language en - English
Page Count 56
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Feb. 24, 2026 BS EN IEC 60749-26:2026 Revision
Not Available Revision