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BSI BS EN 60749-42:2014

Semiconductor devices. Mechanical and climatic test methods -- Temperature and humidity storage
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BSI BS EN 60749-42:2014

Semiconductor devices. Mechanical and climatic test methods -- Temperature and humidity storage

PUBLISH DATE 2014
PAGES 12
BSI BS EN 60749-42:2014

This part of IEC 60749 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments.

This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.

SDO BSI: British Standards Institution
Document Number EN 60749-42
Publication Date Oct. 31, 2014
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Oct. 31, 2014 BS EN 60749-42:2014 Revision