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BSI BS EN 60749-5:2017

Semiconductor devices. Mechanical and climatic test methods -- Steady-state temperature humidity bias life test
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BSI BS EN 60749-5:2017

Semiconductor devices. Mechanical and climatic test methods -- Steady-state temperature humidity bias life test

PUBLISH DATE 2017
PAGES 16
BSI BS EN 60749-5:2017

This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

This test method is considered destructive.

SDO BSI: British Standards Institution
Document Number EN 60749-5
Publication Date July 20, 2017
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
July 20, 2017 BS EN 60749-5:2017 Revision
June 18, 2003 BS EN 60749-5:2003 Revision