Logo
Login Sign Up
Current Revision

BSI DD ISO/TS 10798:2011

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Best Price Guarantee
Instant

$364.34

2-5 Days

$364.34

SAVE 10%

$655.81


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
British Standards Institution Logo

BSI DD ISO/TS 10798:2011

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

PUBLISH DATE 2011
PAGES 38
BSI DD ISO/TS 10798:2011

This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).

SDO BSI: British Standards Institution
Document Number ISO/TS 10798
Publication Date July 31, 2011
Language en - English
Page Count 38
Revision Level
Supercedes
Committee NTI/1
Publish Date Document Id Type View
July 31, 2011 DD ISO/TS 10798:2011 Revision