IEC 60749-4 Ed. 2.0 b:2017

Current Revision
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Semiconductor devices - Mechanical and climatic test methods

Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

This edition includes the following significant technical changes with respect to the previous edition:

  • clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
  • recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
  • allowance of additional time-to-test delay or return-to-stress delay.
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