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IPC/JEDEC-9707

Spherical Bend Test Method for Characterization of Board Level Interconnects
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IPC/JEDEC-9707

Spherical Bend Test Method for Characterization of Board Level Interconnects

PUBLISH DATE 2011
IPC/JEDEC-9707
Spherical Bend Test Method for Characterization of Board Level Interconnects
This standard on spherical transient bend testing is intended to characterize the maximum allowable strain that a surface mount component's board level interconnects can withstand in flexural loading. Whereas four-point monotonic bend test methods only address simple planar bending, spherical bend tests establish strain limits of board level interconnects under worst-case flexure conditions that can occur during conventional printed board/system assembly, manufacturing and test operations. This method is applicable to surface mounted BGA components larger than 15.0 mm on a side with organically based substrates, attached to printed boards using conventional solder reflow technologies.This document was developed cooperatively with JEDEC. 15 pages. Released 2011.Included in the C-103 and C-1000 Collections.
SDO IPC: IPC by Global Electronics Association
Document Number 9707
Publication Date Sept. 13, 2011
Language en - English
Page Count 24
Revision Level 0
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