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IPC/JEDEC-9707-AM1

Spherical Bend Test Method for Characterization of Board Level Interconnects
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IPC/JEDEC-9707-AM1

Spherical Bend Test Method for Characterization of Board Level Interconnects

PUBLISH DATE 2018
IPC/JEDEC-9707-AM1
Spherical Bend Test Method for Characterization of Board Level Interconnects
IPC/JEDEC-9707-AM1 is an amendment which clarifies that the standard is only applicable to transient bending during short-term test operations. The standard specifies a common method of establishing strain limits of board-level device interconnects under spherical transient bending conditions, the worst-case flexure condition that can occur during conventional printed board/system assembly, manufacturing, and test operations.
SDO IPC: IPC by Global Electronics Association
Document Number 9707
Publication Date May 1, 2018
Language en - English
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Revision Level 0
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