Logo
Login Sign Up
Current Revision

ISO 13424:2013

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis
Best Price Guarantee
Instant

$297.00

2-5 Days

$297.00

SAVE 15%

$504.90


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
International Organization for Standardization Logo

ISO 13424:2013

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis

PUBLISH DATE 2026
ISO 13424:2013

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.

SDO ISO: International Organization for Standardization
Document Number ISO 13424
Publication Date April 1, 2026
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 201/SC 7
Publish Date Document Id Type View
April 1, 2026 ISO 13424:2013 Revision