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ISO 17901-2:2015

Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics
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ISO 17901-2:2015

Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics

PUBLISH DATE 2015
ISO 17901-2:2015

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

SDO ISO: International Organization for Standardization
Document Number ISO 17901
Publication Date July 1, 2015
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 172/SC 9
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