All Documents

BSI PD IEC TS 62607-4-7:2018
Nanomanufacturing. Key control characteristics -- Nano-enabled electrical energy storage. Determination of magnetic impurities in anode nanomaterials, ICP-OES method
BSI PD IEC TS 62607-4-7:2018

Nanomanufacturing. Key control characteristics -- Nano-enabled electrical energy storage. Determination of magnetic impurities in anode nanomaterials, ICP-OES method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-4-8:2020
Nanomanufacturing. Key control characteristics -- Nano-enabled electrical energy storage. Determination of water content in electrode nanomaterials, Karl Fischer method
BSI PD IEC TS 62607-4-8:2020

Nanomanufacturing. Key control characteristics -- Nano-enabled electrical energy storage. Determination of water content in electrode nanomaterials, Karl Fischer method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-4-9:2026
Nanomanufacturing. Key control characteristics -- Nano-enabled energy storage. Electrochemical characteristics of carbon nanomaterial for the electrodes of electric double-layer capacitors: Coin cell preparation
BSI PD IEC TS 62607-4-9:2026

Nanomanufacturing. Key control characteristics -- Nano-enabled energy storage. Electrochemical characteristics of carbon nanomaterial for the electrodes of electric double-layer capacitors: Coin cell preparation

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC/TS 62607-5-1:2014
Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Carrier transport measurements
BSI PD IEC/TS 62607-5-1:2014

Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Carrier transport measurements

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-5-3:2020
Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
BSI PD IEC TS 62607-5-3:2020

Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Measurements of charge carrier concentration

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-5-4:2022
Nanomanufacturing. Key control characteristics -- Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)
BSI PD IEC TS 62607-5-4:2022

Nanomanufacturing. Key control characteristics -- Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-1:2020
Nanomanufacturing. Key control characteristics -- Graphene-based material. Volume resistivity: four probe method
BSI PD IEC TS 62607-6-1:2020

Nanomanufacturing. Key control characteristics -- Graphene-based material. Volume resistivity: four probe method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-10:2021
Nanomanufacturing. Key control characteristics -- Graphene-based material. Sheet resistance: Terahertz time-domain spectroscopy
BSI PD IEC TS 62607-6-10:2021

Nanomanufacturing. Key control characteristics -- Graphene-based material. Sheet resistance: Terahertz time-domain spectroscopy

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-13:2020
Nanomanufacturing. Key control characteristics -- Graphene-based material. Oxygen functional group content: Boehm titration method
BSI PD IEC TS 62607-6-13:2020

Nanomanufacturing. Key control characteristics -- Graphene-based material. Oxygen functional group content: Boehm titration method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
  • Historical Versions
Purchase Options
BSI PD IEC TS 62607-6-16:2022
Nanomanufacturing. Key control characteristics -- Two-dimensional materials. Carrier concentration: Field effect transistor method
BSI PD IEC TS 62607-6-16:2022

Nanomanufacturing. Key control characteristics -- Two-dimensional materials. Carrier concentration: Field effect transistor method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-23:2025
Nanomanufacturing - Key control characteristics -- Part 6-23: Graphene-related products - Sheet resistance, carrier density, carrier mobility: Hall bar method
BSI PD IEC TS 62607-6-23:2025

Nanomanufacturing - Key control characteristics -- Part 6-23: Graphene-related products - Sheet resistance, carrier density, carrier mobility: Hall bar method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-24:2026
Nanomanufacturing. Key control characteristics -- Graphene-related products. Number of layers of graphene: optical contrast
BSI PD IEC TS 62607-6-24:2026

Nanomanufacturing. Key control characteristics -- Graphene-related products. Number of layers of graphene: optical contrast

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-26:2025
Nanomanufacturing - Key control characteristics -- Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test
BSI PD IEC TS 62607-6-26:2025

Nanomanufacturing - Key control characteristics -- Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-27:2025
Nanomanufacturing. Key control characteristics -- Graphene-related products. Field-effect mobility for layers of two-dimensional materials: field-effect transistor method
BSI PD IEC TS 62607-6-27:2025

Nanomanufacturing. Key control characteristics -- Graphene-related products. Field-effect mobility for layers of two-dimensional materials: field-effect transistor method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-3:2020
Nanomanufacturing. Key control characteristics -- Graphene-based material. Domain size: substrate oxidation
BSI PD IEC TS 62607-6-3:2020

Nanomanufacturing. Key control characteristics -- Graphene-based material. Domain size: substrate oxidation

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-33:2025 PDF Preview
BSI PD IEC TS 62607-6-33:2025

Nanomanufacturing. Key control characteristics -- Graphene-related products. Defect density of graphene: electron energy loss spectroscopy

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-35:2025
Nanomanufacturing. Key control characteristics -- Graphene-related products. Density: free-pouring, tapping and compressing method
BSI PD IEC TS 62607-6-35:2025

Nanomanufacturing. Key control characteristics -- Graphene-related products. Density: free-pouring, tapping and compressing method

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-6-36:2026
Nanomanufacturing. Key control characteristics -- Graphene-related products. Reduction status of graphene oxide and reduced graphene oxide: UV-Vis absorption spectroscopy
BSI PD IEC TS 62607-6-36:2026

Nanomanufacturing. Key control characteristics -- Graphene-related products. Reduction status of graphene oxide and reduced graphene oxide: UV-Vis absorption spectroscopy

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC/TS 62607-6-4:2016
Nanomanufacturing. Key control characteristics -- Graphene. Surface conductance measurement using resonant cavity
BSI PD IEC/TS 62607-6-4:2016

Nanomanufacturing. Key control characteristics -- Graphene. Surface conductance measurement using resonant cavity

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-7-2:2023
Nanomanufacturing. Key control characteristics -- Nano-enabled photovoltaics. Device evaluation method for indoor light
BSI PD IEC TS 62607-7-2:2023

Nanomanufacturing. Key control characteristics -- Nano-enabled photovoltaics. Device evaluation method for indoor light

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-8-1:2020
Nanomanufacturing. Key control characteristics -- Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current
BSI PD IEC TS 62607-8-1:2020

Nanomanufacturing. Key control characteristics -- Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-8-2:2021
Nanomanufacturing. Key control characteristics -- Nano-enabled metal-oxide interfacial devices. Test method for the polarization properties by thermally stimulated depolarization current
BSI PD IEC TS 62607-8-2:2021

Nanomanufacturing. Key control characteristics -- Nano-enabled metal-oxide interfacial devices. Test method for the polarization properties by thermally stimulated depolarization current

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-8-3:2023
Nanomanufacturing. Key Control Characteristics -- Nano-enabled metal-oxide interfacial devices. Analogue resistance change and resistance fluctuation: Electrical resistance measurement
BSI PD IEC TS 62607-8-3:2023

Nanomanufacturing. Key Control Characteristics -- Nano-enabled metal-oxide interfacial devices. Analogue resistance change and resistance fluctuation: Electrical resistance measurement

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-8-4:2024
Nanomanufacturing. Key control characteristics -- Metal-oxide interfacial devices. Activation energy of electronic trap states: Low-frequency-noise spectroscopy
BSI PD IEC TS 62607-8-4:2024

Nanomanufacturing. Key control characteristics -- Metal-oxide interfacial devices. Activation energy of electronic trap states: Low-frequency-noise spectroscopy

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options
BSI PD IEC TS 62607-9-1:2021
Nanomanufacturing. Key control characteristics -- Traceable spatially resolved nano-scale stray magnetic field measurements. Magnetic force microscopy
BSI PD IEC TS 62607-9-1:2021

Nanomanufacturing. Key control characteristics -- Traceable spatially resolved nano-scale stray magnetic field measurements. Magnetic force microscopy

  • Perpetual Online PDF
  • Printing allowed
  • Delivery
Purchase Options