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BSI BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods -- Acceleration, steady state
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BSI BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods -- Acceleration, steady state

PUBLISH DATE 2003
PAGES 8
BSI BS EN 60749-36:2003
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
SDO BSI: British Standards Institution
Document Number EN 60749-36
Publication Date June 19, 2003
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
June 19, 2003 BS EN 60749-36:2003 Revision