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BSI BS ISO 20263:2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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BSI BS ISO 20263:2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

PUBLISH DATE 2018
BSI BS ISO 20263:2017

This document specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

SDO BSI: British Standards Institution
Document Number ISO 20263
Publication Date Jan. 4, 2018
Language en - English
Page Count
Revision Level
Supercedes
Committee CII/9
Publish Date Document Id Type View
Nov. 19, 2024 BS ISO 20263:2024 Revision
Jan. 4, 2018 BS ISO 20263:2017 Revision