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BSI BS ISO 20263:2024

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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BSI BS ISO 20263:2024

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

PUBLISH DATE 2024
PAGES 56
BSI BS ISO 20263:2024

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SDO BSI: British Standards Institution
Document Number ISO 20263
Publication Date Nov. 19, 2024
Language en - English
Page Count 56
Revision Level
Supercedes
Committee CII/9
Publish Date Document Id Type View
Nov. 19, 2024 BS ISO 20263:2024 Revision
Jan. 4, 2018 BS ISO 20263:2017 Revision