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BSI BS ISO 29301:2017

Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
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BSI BS ISO 29301:2017

Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures

PUBLISH DATE 2018
BSI BS ISO 29301:2017

This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

SDO BSI: British Standards Institution
Document Number ISO 29301
Publication Date Jan. 4, 2018
Language en - English
Page Count
Revision Level
Supercedes
Committee CII/9
Publish Date Document Id Type View
Oct. 26, 2023 BS ISO 29301:2023 Revision
Jan. 4, 2018 BS ISO 29301:2017 Revision
June 30, 2010 BS ISO 29301:2010 Revision