IEC 61189-5-503 Ed. 1.0 b:2017

Current Revision
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

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Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards.

IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF).

It specifies not only the **steady-state temperature and humidity test**, but also a **temperature-humidity cyclic test** and an **unsaturated pressurized vapour test (HAST)**.

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