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IEC 63185 Ed. 1.0 b:2020

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
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IEC 63185 Ed. 1.0 b:2020

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

PUBLISH DATE 2020
PAGES 30
IEC 63185 Ed. 1.0 b:2020
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.
SDO IEC: International Electrotechnical Commission
Document Number IEC 63185
Publication Date Dec. 1, 2020
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 46F
Publish Date Document Id Type View
Not Available Revision
Not Available IEC 63185 Ed. 2.0 b:2025 Revision
Dec. 1, 2020 Revision
Dec. 1, 2020 IEC 63185 Ed. 1.0 b:2020 Revision