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IEC 63185 Ed. 2.0 en:2025

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
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IEC 63185 Ed. 2.0 en:2025

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

IEC 63185 Ed. 2.0 en:2025

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SDO IEC: International Electrotechnical Commission
Document Number IEC 63185
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Not Available Revision
Not Available IEC 63185 Ed. 2.0 b:2025 Revision
Dec. 1, 2020 Revision
Dec. 1, 2020 IEC 63185 Ed. 1.0 b:2020 Revision