Logo
Login Sign Up
Current Revision

IEC 60747-5-10 Ed. 1.0 en:2019

Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
Best Price Guarantee

$131.00

2-5 Days

$131.00

SAVE 10%

$235.80


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
International Electrotechnical Commission Logo

IEC 60747-5-10 Ed. 1.0 en:2019

Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point

PUBLISH DATE 2019
PAGES 20
IEC 60747-5-10 Ed. 1.0 en:2019
Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point

IEC 60747-5-10:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes only the relative external quantum efficiency (EQE) measured at an operating room temperature. In order to identify the reference IQE, an operating current corresponding to the injection efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal change of the relative EQE at that point. The IQE as a function of current is then calculated from the relative ratio of the EQEs to the value at the reference point, which is called room-temperature reference-point method (RTRM).

SDO IEC: International Electrotechnical Commission
Document Number IEC 60747
Publication Date Dec. 1, 2019
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 47E
Publish Date Document Id Type View
Dec. 1, 2019 IEC 60747-5-10 Ed. 1.0 en:2019 Revision
Dec. 1, 2019 Revision