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IEC/TS 62607-6-4 Ed. 1.0 en:2016

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Surface conductance: non-contact microwave resonant cavity method
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International Electrotechnical Commission Logo

IEC/TS 62607-6-4 Ed. 1.0 en:2016

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Surface conductance: non-contact microwave resonant cavity method

PUBLISH DATE 2016
IEC/TS 62607-6-4 Ed. 1.0 en:2016
Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity
IEC TS 62607-6-4:2016(E) establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.
SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62607
Publication Date Sept. 1, 2016
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 113
Publish Date Document Id Type View
June 5, 2024 Revision
Feb. 1, 2024 IEC/TS 62607-6-4 Ed. 2.0 en:2024 Revision
Sept. 1, 2016 IEC/TS 62607-6-4 Ed. 1.0 en:2016 Revision