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IEC/TS 62607-6-6 Ed. 1.0 en:2021

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscoopy
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IEC/TS 62607-6-6 Ed. 1.0 en:2021

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscoopy

PUBLISH DATE 2021
IEC/TS 62607-6-6 Ed. 1.0 en:2021
Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscoopy
IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic
• strain uniformity
for single-layer graphene by
• Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.
SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62607
Publication Date Oct. 1, 2021
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 113
Publish Date Document Id Type View
June 5, 2024 Revision
Oct. 1, 2021 IEC/TS 62607-6-6 Ed. 1.0 en:2021 Revision