Nanomanufacturing. Key control characteristics -- Graphene. Surface conductance measurement using resonant cavity
This part of IEC 62607 establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].
Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.
| SDO | BSI: British Standards Institution |
| Document Number | IEC/TS 62607-6-4 |
| Publication Date | Oct. 31, 2016 |
| Language | en - English |
| Page Count | 22 |
| Revision Level | |
| Supercedes | |
| Committee | NTI/1 |