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IEC/TS 62607-6-11 Ed. 1.0 en:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
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IEC/TS 62607-6-11 Ed. 1.0 en:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

PUBLISH DATE 2022
IEC/TS 62607-6-11 Ed. 1.0 en:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62607
Publication Date Feb. 1, 2022
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 113
Publish Date Document Id Type View
June 5, 2024 Revision
Feb. 1, 2022 IEC/TS 62607-6-11 Ed. 1.0 en:2022 Revision